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“開放靈活的平臺(tái)” T2000——滿足多樣化測(cè)試需求的解決方案
SoC測(cè)試系統(tǒng)T2000產(chǎn)品革新是時(shí)代進(jìn)步的標(biāo)志。隨著SoC器件的生命周期不斷縮短，芯片制造商以往需要兩到三年就購(gòu)買新的測(cè)試設(shè)備或新一代的產(chǎn)品的情況已經(jīng)改變，有了更具成本優(yōu)勢(shì)的新選擇。
T2000系統(tǒng)能使客戶用最小的投資，最短的時(shí)間來(lái)實(shí)現(xiàn)新產(chǎn)品的量產(chǎn)化，并推向市場(chǎng)。
T2000系統(tǒng)是為不斷變化的市場(chǎng)需求推出的革新化的解決方案。
- Features
- Solution
- Scalability
SoC測(cè)試系統(tǒng)T2000Features
While chipmakers enhance the functionality of semiconductor devices and increase multi-functionality, they need to reduce development times. The T2000 is ideal for testing these devices.
Time to Market Reduction - Multi-Session
The T2000 makes it possible to develop device test programs efficiently with minimal investment. With the multi-site CPU architecture unique to the T2000, multiple users can log in to a single test system at the same time, and perform debugging work independently. Up to eight people can work at the same time, contributing to both engineering cost savings and TTM reduction. In addition, eight people can develop separate functions for the same device at the same time, greatly shortening development times.
Best-In-Class Parallel Test Efficiency - Multi-Site Controller
As more DUTs (Devices Under Test) are measured simultaneously, overhead tends to increase, and in general test times tend to be longer. However, the T2000 reduces test time and achieves high throughput with highly efficient multi-site test technology which completely eliminates overhead.
Test Time Reduction - Concurrent Test
The T2000 supports concurrent test functionality which can execute complicated device test in shorter times. Concurrent test can be more easily achieved than in the past, as the T2000 can seamlessly switch between sequential execution and parallel execution of multiple test items. In addition, its concurrent test functionality enables users to rapidly develop test programs with short test times.
Test Cost Reduction
With up to 8,192 digital channels, the T2000 achieves more than twice the parallelism of the previous model, reducing test cost.